Radiation effects in semiconductors
著者
書誌事項
Radiation effects in semiconductors
（Devices, circuits, and systems）
CRC Press, c2011
大学図書館所蔵 件 / 全4件
-
該当する所蔵館はありません
- すべての絞り込み条件を解除する
注記
Includes bibliographical references and index
収録内容
- Radiation damage in silicon / Gianluigi Casse
- Radiation-tolerant CMOS single-photon imagers for multiradiation detection / Edoardo Charbon ... [et al.]
- Effects of hydrogen on the radiation response on field-oxide field-effect transistors and high-k dielectrics / Xing J. Zhou, Daniel M. Fleetwood, and Ronald D. Schrimpf
- Novel total dose and heavy-ion charge collection phenomena in a new SiGe HBT on thin-film SOI technology / Grégory Avenier ... [et al.]
- Radiation-hard voltage and current references in standard CMOS technologies / Vladimir Gromov and Anne-Johan Annema
- Nanocrystal memories : an evolutionary approach to flash memory scaling and a class of radiation-tolerant devices / Cosimo Gerardi ... [et al.]
- Radiation hardened by design SRAM strategies for TID and SEE mitigation / Lawrence T. Clark
- A complete guide to multiple upsets in SRAMs processed in decananometric CMOS technologies / Gilles Gasiot and Phillippe Roche
- Real-time soft error rate characterization of advanced SRAMs / Jean-Luc Autran ... [et al.]
- Fault tolerance techniques and reliability modeling for SRAM-based FPGAs / Keith S. Morgan ... [et al.]
- Assuring robust triple modular redundancy protected circuits in SRAM-based FPGAs / Michael Caffrey ... [et al.]
- SEU/SET tolerant phase-locked loops / Robert L. Shuler, Jr.
- Autonomous detection and characterization of radiation-induced transients in semiconductor integrated circuits / Balaji Narasimham ... [et al.]
- Soft errors in digital circuits : overview and protection techniques for digital filters / Pedro reviriego Vasallo and Juan Antonio Maestro
- Fault-injection techniques for dependability analysis : an overview / Massimo Violante
内容説明・目次
内容説明
Space applications, nuclear physics, military operations, medical imaging, and especially electronics (modern silicon processing) are obvious fields in which radiation damage can have serious consequences, i.e., degradation of MOS devices and circuits. Zeroing in on vital aspects of this broad and complex topic, Radiation Effects in Semiconductors addresses the ever-growing need for a clear understanding of radiation effects on semiconductor devices and circuits to combat potential damage it can cause.
Features a chapter authored by renowned radiation authority Lawrence T. Clark on Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation
This book analyzes the radiation problem, focusing on the most important aspects required for comprehending the degrading effects observed in semiconductor devices, circuits, and systems when they are irradiated. It explores how radiation interacts with solid materials, providing a detailed analysis of three ways this occurs: Photoelectric effect, Compton effect, and creation of electron-positron pairs. The author explains that the probability of these three effects occurring depends on the energy of the incident photon and the atomic number of the target. The book also discusses the effects that photons can have on matter-in terms of ionization effects and nuclear displacement
Written for post-graduate researchers, semiconductor engineers, and nuclear and space engineers with some electronics background, this carefully constructed reference explains how ionizing radiation is creating damage in semiconducting devices and circuits and systems-and how that damage can be avoided in areas such as military/space missions, nuclear applications, plasma damage, and X-ray-based techniques. It features top-notch international experts in industry and academia who address emerging detector technologies, circuit design techniques, new materials, and innovative system approaches.
目次
Section I: Devices
Radiation Damage in Silicon. Radiation-Tolerant CMOS Single-Photon Imagers for Multiradiation Detection Effects of Hydrogen on the Radiation Response of Field-Oxide. Field-Effect Transistors and High-K Dielectrics. Novel Total Dose and Heavy-Ion Charge Collection Phenomena in a New SiGe HBT on Thin-Film SOI Technology. Radiation-Hard Voltage and Current References in Standard CMOS Technologies. Nanocrystal Memories: An Evolutionary Approach to Flash Memory Scaling and a Class of Radiation-Tolerant Devices.
Section II: Circuits and Systems
Radiation Hardened by Design SRAM Strategies for TID and SEE Mitigation. A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies. Real-Time Soft Error Rate Characterization of Advanced SRAMs. Fault Tolerance Techniques and Reliability Modeling for SRAM-Based FPGAs Assuring Robust Triple Modular Redundancy Protected Circuits in SRAM-Based FPGAs. SEU/SET Tolerant Phase-Locked Loops. Autonomous Detection and Characterization of Radiation-Induced Transients in Semiconductor Integrated Circuits. Soft Errors in Digital Circuits: Overview and Protection Techniques for Digital Filters. Fault-Injection Techniques for Dependability Analysis: An Overview. Index.
「Nielsen BookData」 より