Strain-induced effects in advanced MOSFETs

Author(s)

• Sverdlov, Viktor

Bibliographic Information

Strain-induced effects in advanced MOSFETs

Viktor Sverdlov

（Computational microelectronics）

Springer-Verlag, c2011

Note

Includes bibliographical references

Details

• NCID: BB06388199
• ISBN:
  • 9783709103814
• LCCN: 89026322
• Country Code: au
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Wien ; New York
• Pages/Volumes: xiv, 252 p.
• Size: 25 cm
• Classification:
  • DC20 : 621.381/528
• Subject Headings:
  • LCSH : Metal oxide semiconductor field-effect transistors
• Parent Bibliography ID:
  • BA07039697