Applications of finite element methods for reliability studies on ULSI interconnections

著者

• Tan, Cher Ming

書誌事項

Applications of finite element methods for reliability studies on ULSI interconnections

Cher Ming Tan ... [et al.]

（Springer series in reliability engineering）

Springer, c2011

• : hbk

注記

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BB06923623
• ISBN:
  • 9780857293091
• 出版国コード: uk
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: London
• ページ数/冊数: vii, 150 p.
• 大きさ: 24 cm
• 分類:
  • DC22 : 621.395
• 件名:
  • LCSH : Integrated circuits -- Ultra large scale integration
  • LCSH : Finite element method
  • LCSH : Reliability (Engineering)
• 親書誌ID:
  • BA7365581X