Annual Reliability and Maintainability Symposium, 2011 proceedings : Lake Buena Vista, Florida, USA, 24-27 January, 2011

Bibliographic Information

Annual Reliability and Maintainability Symposium, 2011 proceedings : Lake Buena Vista, Florida, USA, 24-27 January, 2011

Institute of Electrical and Electronics Engineers, c2011

Other Title

RAMS 2011

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Note

"IEEE catalog number: CFP11RAM-PRT"

Includes bibliographies and indexes

Details

  • NCID
    BB07160673
  • ISBN
    • 9781424488575
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Piscataway, NJ
  • Pages/Volumes
    [18], 574 p.
  • Size
    27 cm
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