X-Ray scattering
著者
書誌事項
X-Ray scattering
（Materials science and technologies series）
Nova Science Publishers, c2012
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystallographic structure, chemical composition and physical properties of materials and thin films. These techniques are based on observing the scattered intensity of an X-ray beam hitting a sample as a function of incident and scattered angle, polarization, and wavelength or energy. In this book, the authors present current research in the study of X-ray scattering, including real-time synchrotron X-ray scattering, applications of X-ray scattering in edible lipid systems; X-ray scattering of bacterial cell wall compounds and their neutralization and small angle X-ray scattering analysis of nanomaterials for ultra large scale integrated circuits.
目次
- Preface
- In situ, Real-Time Synchrotron X-ray Scattering
- Applications of X-ray Scattering in Edible Lipid Systems
- Small angle X-ray Scattering Analysis of Nanomaterials for Ultra Large Scale Integrated Circuits
- X-ray Scattering of Bacterial Cell Wall Compounds & their Neutralization
- Decomposition of WAXS Diffractograms of Semicrystalline Polymers by Simulated Annealing
- SAXS/WAXS Characterization of Sol-Gel Derived Nanomaterials
- Depth Profile Analysis of Surface Layer Structure using X-ray Diffraction at Small Glancing Angles of Incidence
- Small Angle X-ray Diffraction of Filamentous Cytoskeletal Proteins
- Index.
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