Applied charged particle optics

書誌事項

Applied charged particle optics

by Helmut Liebl

Springer, c2010

  • : pbk
  • : ebk

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注記

Includes bibliographica references (p.[127]-128) and index

内容説明・目次

巻冊次

: ebk ISBN 9783540719250

内容説明

Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.
巻冊次

: pbk ISBN 9783642091032

内容説明

Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement.

目次

Lenses: Basic Optics.- Electrostatic Deflection.- Magnetic Deflection.- Image Aberrations.- Fringe Field Confinement.

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詳細情報

  • NII書誌ID(NCID)
    BB07674998
  • ISBN
    • 9783642091032
    • 9783540719250
  • 出版国コード
    gw
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Berlin
  • ページ数/冊数
    x, 130 p.
  • 大きさ
    23 cm
  • 分類
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