Handbook of instrumentation and techniques for semiconductor nanostructure characterization
著者
書誌事項
Handbook of instrumentation and techniques for semiconductor nanostructure characterization
（World scientific series in materials and energy / series editor, Leonard C. Feldman, 1-2）
World Scientific, c2012
- vol. 1
- vol. 2
- set
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
'... These volumes provide the very latest in this critical technology and are an invaluable resource for scientists in both academia and industry concerned with the semiconductor future and all of science.'Foreword by Leonard C Feldman (Director Institute for Advanced Materials, Devices and Nanotechnology, Rutgers University, USA)HighlightsAs we delve more deeply into the physics and chemistry of functional materials and processes, we are inexorably driven to the nanoscale. And nowhere is the development of instrumentation and associated techniques more important to scientific progress than in the area of nanoscience. The dramatic expansion of efforts to peer into nanoscale materials and processes has made it critical to capture and summarize the cutting-edge instrumentation and techniques that have become indispensable for scientific investigation in this arena. This Handbook is a key resource developed for scientists, engineers and advanced graduate students in which eminent scientists present the forefront of instrumentation and techniques for the study of structural, optical and electronic properties of semiconductor nanostructures.
目次
- Atom Probe Tomography
- Plasmon Dynamics of Nanostructured Surfaces
- Scanning Tunneling Microscopy of Self Assembled III-V Nanostructures
- Nanomembranes
- Aberration Corrected Scanning Transmission Microscopy and Electron Energy Loss
- Rayleigh Scattering from Carbon Nanotubes
- Low Energy Electron Microscopy Studies of Nanostructured Semiconductor Surfaces
- Scanning Probe Microscopy of GaN Based Structures
- Time Domain Thermoreflectance for Thermal Characterization of Nanostructures
- X-Ray Studies of Nanostructures
- Single Nanowire Photoelectron Spectroscopy
- Ultra-High Vacuum Transmission Electron Microscopy
- Synthesis and Studies of Low-Dimensional Structures
- Raman Spectroscopy of Carbon Nanotubes
- Scanning Electron Microscopy for Characterization of Semiconducting Nanowires
- X-Ray Diffraction for Stress Determination in Nanostructures.
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