The 10th international conference on x-ray microscopy : Chicago, Illinois, USA, 15-20 August 2010
著者
書誌事項
The 10th international conference on x-ray microscopy : Chicago, Illinois, USA, 15-20 August 2010
（AIP conference proceedings, 1365）
American Institute of Physics, c2011
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
This conference proceedings would be of interest to researchers and students in universities, national laboratories, synchrotron and x-ray laser facilities, and industries in the technical fields. Fields of interest include high-resolution x-ray microscopy and imaging, magnetism and magnetic materials, biological and biomedical sciences, and materials and condensed matter sciences. The 10th International Conference on X-ray Microscopy (XRM 2010) was held on August 15-20, 2010 in Chicago, Illinois, USA. The latest advances in x-ray microscopy instrumentation and methods and their applications to biology, environmental, magnetism, and materials science were presented at XRM 2010.
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