Advances in spectroscopy and imaging of surfaces and nanostructures : symposium held November 29-December 3, Boston, Massachusetts, U.S.A.
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Bibliographic Information
Advances in spectroscopy and imaging of surfaces and nanostructures : symposium held November 29-December 3, Boston, Massachusetts, U.S.A.
(Materials Research Society symposium proceedings, v. 1318)
Materials Research Society , Cambridge University Press, 2011
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Includes bibliographical references and index
"... frou symposia that were held at the Fall MRS 2010 meeting in Boston and .. Symposium SS: 'Advanced Imaging and Scattering Techniques for In Situ Studies', TT: 'In Situ X-Ray Synchrotron Radiation Spectroscopies in Energy-Related Materials Science and Heterogeneous Catalysis', UU: 'Real-Time Studies of Evolving Thin Films and Interfaces' and VV: 'Novel Development and Applications of Scanning Probe Microscopy'--Pref.
Description and Table of Contents
Description
Table of Contents
- Part I. Advanced Imaging and Scattering Techniques for In Situ Studies: 1. In situ imaging at the NIST neutron imaging facility David Jacobson
- 2. Low energy Ne scattering spectroscopy for insulators, and materials in the electric/magnetic fields Kenji Umezawa
- 3. Electron phase microscopy of magnetic fields in ferromagnets and superconductors Akira Tonomura
- 4. Effect of oxygen pressure on the initial oxidation behavior of Cu and Cu-Au alloys Guangwen Zhou
- 5. Automated crystallite orientation and phase mapping in the transmission electron microscope Peter Moeck
- Part II. In Situ X-Ray Synchrotron Radiation Spectroscopies in Energy-Related Materials Science and Heterogeneous Catalysis: 6. Electronic structures of non-Pt carbon alloy catalysts for polymer electrolyte membrane fuel cells revealed by synchrotron radiation analyses Masaharu Oshima
- 7. Quantum rods and dots-based structures and devices: low cost aqueous synthesis and bandgap engineering for solar hydrogen and solar cells applications Lionel Vayssieres
- Part III. Real-Time Studies of Evolving Thin Films and Interfaces: 8. Formation of irregular Al islands by room-temperature deposition on NiAl(110) Jim Evans
- 9. In-situ TEM observation of formation-retraction-fracture experiment of liquid-like silicon nanocontact Tadashi Ishida
- 10. Observation of real-time thin film evolution using microcantilever sensors Alan Schilowitz
- 11. X-ray study of strained and strain balanced superlattice materials Natee Johnson
- 12. In-situ XRD and FIB microscopy studies of the dynamics of intermetallic phase formation in thin layer Cu/Sn films for low-temperature isothermal diffusion soldering Harald Etschmaier
- 13. Stochastic models of epitaxial growth Dionisios Margetis
- 14. Characterisation of organic semiconductor growth using real-time electron spectroscopy Andrew Evans
- 15. The electrical conduction at early stages of cluster-assembled films growth Emanuele Barborini
- 16. Spreading kinetics at a molecular level Jean-Luc Buraud
- Part IV. Real-Time Studies of Evolving Thin Films and Interfaces: 17. Multiparameter imaging and understanding the role of the tip - atomic resolution images of rutile TiO2 (110) John Pethica
- 18. Experimental and theoretical study of the new image force microscopy principle H. Kumar Wickramasinghe
- 19. Crystallographic processing of scanning tunneling microscopy images of cobalt phthalocyanines on silver and graphite Peter Moeck
- 20. Scanning thermal lithography as a tool for highly localized nanoscale chemical surface functionalization Joost Duvigneau
- 21. Digital pulsed force mode AFM and confocal Raman microscopy in drug-eluting coatings research Greg Haugstad
- 22. Measurement of piezoelectric transverse and longitudinal displacement with atomic force microscopy for PZT thick films Yuta Kashiwagi
- 23. Circular AFM mode: a new AFM mode for investigating surface properties Olivier Noel
- 24. Scanning probe microscopy with diamond tip in tribo-nanolithography Oleg Lysenko
- 25. Photoinduced temporal change of surface-potential undulation on Alq3 thin films observed by Kelvin probe force microscopy Kazunari Ozasa
- 26. Atomic force microscopy based quantitative mapping of elastic moduli in phase separated polyurethanes and silica reinforced rubbers across the length scales Peter Schoen
- 27. In situ chemical functionalization of a single carbon nanotube functionalized AFM tip using a correlated optical and atomic force microscope Katherine Willets.
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