Life-cycle assessment of semiconductors

著者

    • Boyd, Sarah B.
    • Horvath, Arpad

書誌事項

Life-cycle assessment of semiconductors

by Sarah B. Boyd ; foreword by Arpad Horvath

Springer, c2012

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注記

Includes bibliographical references

内容説明・目次

内容説明

Life-Cycle Assessment of Semiconductors presents the first and thus far only available transparent and complete life cycle assessment of semiconductor devices. A lack of reliable semiconductor LCA data has been a major challenge to evaluation of the potential environmental benefits of information technologies (IT). The analysis and results presented in this book will allow a higher degree of confidence and certainty in decisions concerning the use of IT in efforts to reduce climate change and other environmental effects. Coverage includes but is not limited to semiconductor manufacturing trends by product type and geography, unique coverage of life-cycle assessment, with a focus on uncertainty and sensitivity analysis of energy and global warming missions for CMOS logic devices, life cycle assessment of flash memory and life cycle assessment of DRAM. The information and conclusions discussed here will be highly relevant and useful to individuals and institutions.

目次

1 Introduction.- 2 Semiconductor LCI Methods.- 3 Semiconductor Manufacturing Trends in Product Type and Geography.- 4 Life-cycle Energy and Global Warming Emissions of CMOS Logic.- 5 Life-cycle Assessment of CMOS Logic.- 6 Life-cycle Assessment of Flash Memory.- 7 Life-cycle Assessment of Dynamic Random Access Memory.- 8 Semiconductor LCA: The Road Ahead.

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詳細情報

  • NII書誌ID(NCID)
    BB08480217
  • ISBN
    • 9781441999870
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    New York
  • ページ数/冊数
    xxvii, 226 p.
  • 大きさ
    25 cm
  • 分類
  • 件名
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