Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A.

Author(s)

• Baklanov, Mikhail
• Materials, Processes, and Reliability for Advanced Interconnects for Micro- and Nanoelectronics
• Materials Research Society. Spring Meeting

Bibliographic Information

Materials, processes, and reliability for advanced interconnects for micro- and nanoelectronics--2011 : symposium held April 25-29, 2011, San Francisco, California, U.S.A.

editors, Mikhail R. Baklanov ... [et al.]

（Materials Research Society symposium proceedings, v. 1335）

Materials Research Society , Cambridge University Press, 2012

• : hard

Note

"Symposium O, 'Materials, Processes, and Reliability for Advanced Interconnects for Micro- and Nanoelectronics', held at the April 25-29, 2011 MRS Spring Meeting in San Francisco, California"--P. ix

Includes bibliographical references and indexes

Details

• NCID: BB08538361
• ISBN:
  • 9781605113128
• LCCN: 2011276248
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Warrendale, Pa.,Cambridge ; New York
• Pages/Volumes: ix, 127 p.
• Size: 24 cm
• Classification:
  • LCC : TK7874.53
• Subject Headings:
  • LCSH : Interconnects (Integrated circuit technology) -- Congresses
  • LCSH : Integrated circuits -- Very large scale integration -- Congresses
  • LCSH : Microelectronics -- Congresses
  • LCSH : Nanoelectronics -- Congresses
  • LCSH : Materials -- Congresses
• Parent Bibliography ID:
  • BA00013775