Test and diagnosis for small-delay defects

著者

• Tehranipoor, Mohammad H.
• Peng, Ke
• Chakrabarty, Krishnendu

書誌事項

Test and diagnosis for small-delay defects

Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty

Springer, c2011

詳細情報

• NII書誌ID(NCID): BB0887100X
• ISBN:
  • 9781441982964
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New York
• ページ数/冊数: xviii, 212 p.
• 大きさ: 24 cm.
• 分類:
  • DC22 : 621.3950287
• 件名:
  • LCSH : Integrated circuits -- Very large scale integration -- Defects
  • LCSH : Integrated circuits -- Very large scale integration -- Testing
  • LCSH : Delay faults (Semiconductors)