Accelerated reliability and durability testing technology

Author(s)

• Klyatis, Lev M.

Bibliographic Information

Accelerated reliability and durability testing technology

Lev M. Klyatis

（Wiley series in systems engineering）

Wiley, c2012

Note

Includes bibliographical references and index

Details

• NCID: BB08994859
• ISBN:
  • 9780470454657
• LCCN: 2009017252
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Hoboken, N.J.
• Pages/Volumes: xviii, 411 p.
• Size: 25 cm
• Classification:
  • LCC : TS173
  • DC22 : 620/.00452
• Subject Headings:
  • LCSH : Reliability (Engineering)
  • LCSH : Accelerated life testing
• Parent Bibliography ID:
  • BA10838688