In-situ electron microscopy : applications in physics, chemistry and materials science

著者

• Dehm, Gerhard
• Howe, James M.
• Zweck, Josef

書誌事項

In-situ electron microscopy : applications in physics, chemistry and materials science

edited by Gerhard Dehm, James M. Howe, and Josef Zweck

Wiley-VCH, c2012

注記

Includes bibliographical references and index

内容説明・目次

内容説明

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

目次

((short)) Basics Thermodynamics Mechanical Properties Magnetic Properties Optical Properties Electronic Properties Ferroelectric Properties Soft Matter ((long)) I. Basics Scanning Electron Microscopy (SEM) Focused Ion Beam Microscopy (FIB) Transmission Electron Microscopy (including HRTEM and STEM) Camera Systems for Dynamic TEM Experiments II. Thermodynamics Growth Processes Melting and Pre-melting Chemical Reactions and Oxidation Interface Kinetcs Formation of Silicides from a-Si and metal layers Formation of Surface Patterns observed by Reflection Electron Microscopy III. Mechanical Properties The FIB Platform Mechanical Tests in the SEM Strain Mapping by Image Correlation (SEM to HRTEM) Dislocation Mechanisms New Developments: In-situ Nanoindentation, AFM, and STM Experiments in the TEM IV. Magnetic Properties Lorentz-Microscopy Dynamic Observations of Domains, Vortices and of Ultrafast Phenomena by TEM and PEEM V. Optical Properties Cathodoluminiscence in SEM and TEM Optical Properties of Nanotubes VI. Electronic Properties EBIC (SEM) and Potential Contrast Electromigration (SEM, TEM) VII. Ferroelectric Properties Ferroelectric Domains VIII. Soft Matter Experiments using Wet-cells (SEM, ESEM, biological samples and materials) Structure Determination of Soft Matter using In-situ Techniques

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詳細情報

• NII書誌ID(NCID): BB09129991
• ISBN:
  • 9783527319732
• 出版国コード: gw
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Weinheim
• ページ数/冊数: xviii, 383 p.
• 大きさ: 25 cm
• 分類:
  • DC23 : 502.825
• 件名:
  • LCSH : Electron microscopy