XAFS V : proceedings of the 5th International Conference on X-ray Absorption Fine Structure, held in Seattle, WA,USA on August 21-26, 1988

Author(s)

• International Conference on X-Ray Absorption Fine Structures
• León, Jose Mustre de
• Sayers, Dale E.
• Ma, Yanjun
• Rehr, John J.

Bibliographic Information

XAFS V : proceedings of the 5th International Conference on X-ray Absorption Fine Structure, held in Seattle, WA,USA on August 21-26, 1988

editors: Jose Mustre de León, Edward A. Stern, Dale E. Sayers, Yanjun Ma, John J. Rehr

North-Holland, 1989

Other Title

XAFS

Details

• NCID: BB09185653
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Amsterdam
• Pages/Volumes: xxvi, 732p.
• Size: 27 cm