XAFS V : proceedings of the 5th International Conference on X-ray Absorption Fine Structure, held in Seattle, WA,USA on August 21-26, 1988

著者

• International Conference on X-Ray Absorption Fine Structures
• León, Jose Mustre de
• Sayers, Dale E.
• Ma, Yanjun
• Rehr, John J.

書誌事項

XAFS V : proceedings of the 5th International Conference on X-ray Absorption Fine Structure, held in Seattle, WA,USA on August 21-26, 1988

editors: Jose Mustre de León, Edward A. Stern, Dale E. Sayers, Yanjun Ma, John J. Rehr

North-Holland, 1989

タイトル別名

XAFS

詳細情報

• NII書誌ID(NCID): BB09185653
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Amsterdam
• ページ数/冊数: xxvi, 732p.
• 大きさ: 27 cm