ISTFA 1987 : International Symposium for Testing and Failure Analysis : the failure analysis forum for microelectronics and advanced materials : proceedings of the Microelectronics Symposium : 9-13 November 1987, Los Angeles Airport Hilton & Tower, Los Angeles, California, USA
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Bibliographic Information
ISTFA 1987 : International Symposium for Testing and Failure Analysis : the failure analysis forum for microelectronics and advanced materials : proceedings of the Microelectronics Symposium : 9-13 November 1987, Los Angeles Airport Hilton & Tower, Los Angeles, California, USA
ASM International, c1987
- Other Title
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International Symposium for Testing and Failure Analysis
Microelectronics
ISTFA/87 : proceedings of the International Symposium for Testing and Failure Analysis : microelectronics
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