ISTFA 1987 : International Symposium for Testing and Failure Analysis : the failure analysis forum for microelectronics and advanced materials : proceedings of the Microelectronics Symposium : 9-13 November 1987, Los Angeles Airport Hilton & Tower, Los Angeles, California, USA

著者

• International Symposium for Testing and Failure Analysis

書誌事項

ISTFA 1987 : International Symposium for Testing and Failure Analysis : the failure analysis forum for microelectronics and advanced materials : proceedings of the Microelectronics Symposium : 9-13 November 1987, Los Angeles Airport Hilton & Tower, Los Angeles, California, USA

ASM International, c1987

タイトル別名

International Symposium for Testing and Failure Analysis

Microelectronics

ISTFA/87 : proceedings of the International Symposium for Testing and Failure Analysis : microelectronics

詳細情報

• NII書誌ID(NCID): BB0962471X
• ISBN:
  • 0871703114
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Metals Park, Ohio
• ページ数/冊数: xi, 289 p.
• 大きさ: 28 cm