ISTFA '94 : proceedings of the 20th International Symposium for Testing and Failure Analysis, 13-18 November 1994, Los Angeles, California

Author(s)

• International Symposium for Testing and Failure Analysis (20th : 1994 : Los Angeles, Calif.)
• ASM International. Electronic Materials and Processing Division

Bibliographic Information

ISTFA '94 : proceedings of the 20th International Symposium for Testing and Failure Analysis, 13-18 November 1994, Los Angeles, California

sponsored by ASM International

ASM International, c1994

Note

Includes bibliographical references

Details

• NCID: BB09625315
• ISBN:
  • 0871705435
• LCCN: 94072803
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Materials Park, Ohio
• Pages/Volumes: xiii, 505 p.
• Size: 28 cm
• Classification:
  • LCC : TK7871
• Subject Headings:
  • LCSH : Electronics -- Materials -- Testing -- Congresses
  • LCSH : Electronic apparatus and appliances -- Testing -- Congresses