Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies
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書誌事項
Methods for extending high-performance automated test equipment (ATE) using multi-gigahertz FPGA technologies
UMI : ProQuest, c2011
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注記
Reprint of the author's thesis (Ph.D)--Electrical and Computer Engineering, Georgia Institute of Technology, 2011
Includes bibliographical references (p. 254-263)
UMI no: 3464085