Design, analysis and test of logic circuits under uncertainty

Author(s)

• Krishnaswamy, Smita
• Markov, Igor L.
• Hayes, John P.

Bibliographic Information

Design, analysis and test of logic circuits under uncertainty

Smita Krishnaswamy, Igor L. Markov, John P. Hayes

（Lecture notes in electrical engineering, 115）

Springer, c2013

• hbk.

Note

Includes bibliographical references and index

Details

• NCID: BB11880585
• ISBN:
  • 9789048196432
• Country Code: ne
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Dordrecht
• Pages/Volumes: xi, 123 p.
• Size: 25 cm
• Parent Bibliography ID:
  • BA82662099