Interferometry principles and applications
著者
書誌事項
Interferometry principles and applications
（Physics research and technology）
Nova Science Publishers, c2012
- : hardcover
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
Interferometry makes use of the principle of superposition to combine separate waves together in a way that will cause the result of their combination to have some meaningful property that is diagnostic of the original state of the waves. This book presents current research in the principles and applications of interferometry. Topics discussed include speckle methods for material analysis; using White Light Interferometry for accurate topographic measurements of surfaces; cyclic path interferometric configuration applications; phase-stepping algorithms; periodic error measurement for heterodyne interferometry and high contrast Schlieren diffraction interferometry..
目次
- Preface
- Speckle Methods for Material Analysis
- The Production & Accurate Measurement of a 1 Millimeter Step Standard Using a Commercial & a Laboratory White Light Interferometer
- Cyclic Path Interferometric Configuration: Some Applications
- Single-Shot Phase-Grating Phase-Shifting Interferometry
- SAR Interferometry Fundamentals & Historic Evolution in Terrain Movements Applications
- High Contrast Schlieren Diffraction Interferometry
- Binary Grating Interferometry with Two Windows
- Electronic Speckle Pattern Interferometry: Principles & Applications
- Periodic Error Measurement for Heterodyne Interferometry
- Maximum Likelihood Estimation of Optical Signal Parameters
- Phase-Stepping Algorithms: Overview & Simulations
- Generalized Carre Multi-Step Phase-Shifting Algorithms.
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