Scanning microscopy for nanotechnology : techniques and applications

Bibliographic Information

Scanning microscopy for nanotechnology : techniques and applications

edited by Weilie Zhou and Zhong Lin Wang

Springer, c2010

  • : [pbk.]

Available at  / 1 libraries

Search this Book/Journal

Note

Includes bibliographical references and indexes

Description and Table of Contents

Description

This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book is written by international experts from the top nano-research groups that specialize in nanomaterials characterization. The book will appeal to nanomaterials researchers, and to SEM development specialists.

Table of Contents

Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low kV Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and DualBeam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.

by "Nielsen BookData"

Details

  • NCID
    BB13568838
  • ISBN
    • 9781441922090
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    New York
  • Pages/Volumes
    xiv, 522 p.
  • Size
    23 cm
  • Classification
  • Subject Headings
Page Top