Semiconductor X-ray detectors

著者

    • Lowe, B. G.
    • Sareen, R. A.

書誌事項

Semiconductor X-ray detectors

B. G. Lowe, R. A. Sareen

(Series in sensors)

CRC Press/Taylor & Francis, c2014

  • : hardback

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

Identifying and measuring the elemental x-rays released when materials are examined with particles (electrons, protons, alpha particles, etc.) or photons (x-rays and gamma rays) is still considered to be the primary analytical technique for routine and non-destructive materials analysis. The Lithium Drifted Silicon (Si(Li)) X-Ray Detector, with its good resolution and peak to background, pioneered this type of analysis on electron microscopes, x-ray fluorescence instruments, and radioactive source- and accelerator-based excitation systems. Although rapid progress in Silicon Drift Detectors (SDDs), Charge Coupled Devices (CCDs), and Compound Semiconductor Detectors, including renewed interest in alternative materials such as CdZnTe and diamond, has made the Si(Li) X-Ray Detector nearly obsolete, the device serves as a useful benchmark and still is used in special instances where its large, sensitive depth is essential. Semiconductor X-Ray Detectors focuses on the history and development of Si(Li) X-Ray Detectors, an important supplement to the knowledge now required to achieve full understanding of the workings of SDDs, CCDs, and Compound Semiconductor Detectors. The book provides an up-to-date review of the principles, practical applications, and state of the art of semiconductor x-ray detectors. It describes many of the facets of x-ray detection and measurement using semiconductors, from manufacture to implementation. The initial chapters present a self-contained summary of relevant background physics, materials science, and engineering aspects. Later chapters compare and contrast the assembly and physical properties of systems and materials currently employed, enabling readers to fully understand the materials and scope for applications.

目次

Introduction. Detector Response Function. Detector Artifacts. Contacts. Si(Li) X-Ray Detectors. HPSi and HPGe X-Ray Detectors. X-Ray Detectors Based on Silicon Lithography and Planar Technology. CCD-Based X-Ray Detectors. Silicon Drift Detectors. Wide Band-Gap Semiconductors. The History of Semiconductor X-Ray Detectors.

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詳細情報

  • NII書誌ID(NCID)
    BB14768810
  • ISBN
    • 9781466554009
  • 出版国コード
    us
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Boca Raton
  • ページ数/冊数
    xxx, 585 p.
  • 大きさ
    24 cm
  • 親書誌ID
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