Scanning electron microscopy and X-ray microanalysis

Author(s)

Bibliographic Information

Scanning electron microscopy and X-ray microanalysis

Joseph I. Goldstein, Dale E. Newbury ... [et al.]

Springer Science+Business Media, [201-], c2003

3rd ed

  • : [pbk.]

Available at  / 1 libraries

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Note

"Originally published by Springer Science+Business Media,LLC in 2003"--T.p. verso

"Softcover reprint of the hardcover 3rd edition 2003"--T.p. verso

"Corrected at 6th printing 2007"--T.p. verso

Includes bibliographical and index

Details

  • NCID
    BB1671047X
  • ISBN
    • 9781461349693
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    New York
  • Pages/Volumes
    xix, 690 p.
  • Size
    26 cm.
  • Subject Headings
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