Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis
著者
書誌事項
Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis
Imperial College Press, c2015
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
目次
- Introduction
- Historical Survey of Development of STEM
- Basic Knowledge
- Theories for ADF-STEM Image Simulation
- Application of ADF-STEM Imaging to Nanomaterials Science
- Fitting between STEM Images and the First Principles Structure Calculation
- STEM/EELS Elemental Mapping
- Three-Dimensional Tomographic Imaging by STEM
- Scanning Confocal EM (SCEM)
- STEM Holography and Lorentz STEM
- Future Prospects.
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