Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis

著者

書誌事項

Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis

editor Nobuo Tanaka

Imperial College Press, c2015

大学図書館所蔵 件 / 全7件

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注記

Includes bibliographical references and index

内容説明・目次

内容説明

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

目次

  • Introduction
  • Historical Survey of Development of STEM
  • Basic Knowledge
  • Theories for ADF-STEM Image Simulation
  • Application of ADF-STEM Imaging to Nanomaterials Science
  • Fitting between STEM Images and the First Principles Structure Calculation
  • STEM/EELS Elemental Mapping
  • Three-Dimensional Tomographic Imaging by STEM
  • Scanning Confocal EM (SCEM)
  • STEM Holography and Lorentz STEM
  • Future Prospects.

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