ToF-SIMS : materials analysis by mass spectrometry

Author(s)

    • Vickerman, J. C.
    • Briggs, D. (David)

Bibliographic Information

ToF-SIMS : materials analysis by mass spectrometry

edited by John C. Vickerman, David Briggs

IM Publications and SurfaceSpectra, c2013

2nd ed

Available at  / 3 libraries

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Note

Includes bibliographical references and index

Description and Table of Contents

Description

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging in two and three dimensions, and microanalysis. This is the Second Edition of the first book to be dedicated to the subject and the treatment is comprehensive. Following overview and historical chapters, there are sections devoted to instrumentation and sample handling, fundamentals and molecular dynamics simulations, optimisation methods - including laser post-ionisation of sputtered neutrals, data interpretation and analytical applications. All the contributors are internationally recognised as leaders in their respective fields and come from both Europe, USA and Asia.

Table of Contents

Contents Prologue: ToF-SIMS - An evolving mass spectrometry of materials (John C. Vickerman The history of Static SIMS - A personal perspective (Alfred Benninghoven) Status of cascad theory (Herbert M. Urbassek) Fundamentals of organic SIMS: insights from experiments and models (Arnaud Delcorte) Molecular speciation analysis of inorganic compounds (Luc van Vaeck) Molecular dynamics simulations, the theorectical partner to dynamic cluster SIMS experiments (Barbara J.Garrison and Zbigniew Postawa)) Cationisation (Birgit Hagenhoff) Laser post-ionisation - fundamentals (Andreas Wucher) Time-of-flight mass analysers (Bruno W. Schueler) Analysis beams used in toF-SIMS (Rowland Hill) Cluster and polyatomic primary ion beams (John S. fletcher and Christopher Szakal) Molecular depth profiling (Alex Shard, Ian Gilmore and Andreas Wucher) Role of operating conditions in ToF-SIMS (Ian Gilmore) Laser post-ionisation for elemental and molecular surface analysis (Nicholoas P. Lockyer) Sample handling for ToF-SIMS (Fraser Reich) Qualitative interpretation of spectra (David Briggs and Ian W. Fletcher) Multivariate analysis of SIMS spectra (Alex Henderson) ToF-SIMS image analysis (Bonnie J. Tyler) Characterisation of polymeric materials (Lutao Weng and Chiming Chan) li>Functional modification of surfaces using self-assembled monolayers (Amy Walker) Application of SIMS to study of biological systems (Alain M. Piwowar and Nicholas Winograd) Medical and biological applications of cluster ToF-SIMS (David Touboul, Oliver Laprevote and Alain Brunelle) Depth profiling of inorganic materials (Ewald Niehuis and Thomas Grehl) Depth profiling in organic electronics (Ewald Niehuis) Contamination monitoring and failure analysis (Arwa Ginwalla, Thomas, F. Fister and Ian A. Mowat) Photographic and digital graphic materials (Luc van Vaeck, Yannick Vercammen, Jens Lenaerts, Roel de Mondt, Jaymes van Luppen and Frank Vangaever) Applications of ToF-SIMS in cosmochemistry (Thomas Stephan and Ian C. Lyon) Index

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