ToF-SIMS : materials analysis by mass spectrometry
Author(s)
Bibliographic Information
ToF-SIMS : materials analysis by mass spectrometry
IM Publications and SurfaceSpectra, c2013
2nd ed
Available at 3 libraries
  Aomori
  Iwate
  Miyagi
  Akita
  Yamagata
  Fukushima
  Ibaraki
  Tochigi
  Gunma
  Saitama
  Chiba
  Tokyo
  Kanagawa
  Niigata
  Toyama
  Ishikawa
  Fukui
  Yamanashi
  Nagano
  Gifu
  Shizuoka
  Aichi
  Mie
  Shiga
  Kyoto
  Osaka
  Hyogo
  Nara
  Wakayama
  Tottori
  Shimane
  Okayama
  Hiroshima
  Yamaguchi
  Tokushima
  Kagawa
  Ehime
  Kochi
  Fukuoka
  Saga
  Nagasaki
  Kumamoto
  Oita
  Miyazaki
  Kagoshima
  Okinawa
  Korea
  China
  Thailand
  United Kingdom
  Germany
  Switzerland
  France
  Belgium
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  United States of America
Note
Includes bibliographical references and index
Description and Table of Contents
Description
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging in two and three dimensions, and microanalysis. This is the Second Edition of the first book to be dedicated to the subject and the treatment is comprehensive. Following overview and historical chapters, there are sections devoted to instrumentation and sample handling, fundamentals and molecular dynamics simulations, optimisation methods - including laser post-ionisation of sputtered neutrals, data interpretation and analytical applications. All the contributors are internationally recognised as leaders in their respective fields and come from both Europe, USA and Asia.
Table of Contents
Contents Prologue: ToF-SIMS - An evolving mass spectrometry of materials (John C. Vickerman The history of Static SIMS - A personal perspective (Alfred Benninghoven) Status of cascad theory (Herbert M. Urbassek) Fundamentals of organic SIMS: insights from experiments and models (Arnaud Delcorte) Molecular speciation analysis of inorganic compounds (Luc van Vaeck) Molecular dynamics simulations, the theorectical partner to dynamic cluster SIMS experiments (Barbara J.Garrison and Zbigniew Postawa)) Cationisation (Birgit Hagenhoff) Laser post-ionisation - fundamentals (Andreas Wucher) Time-of-flight mass analysers (Bruno W. Schueler) Analysis beams used in toF-SIMS (Rowland Hill) Cluster and polyatomic primary ion beams (John S. fletcher and Christopher Szakal) Molecular depth profiling (Alex Shard, Ian Gilmore and Andreas Wucher) Role of operating conditions in ToF-SIMS (Ian Gilmore) Laser post-ionisation for elemental and molecular surface analysis (Nicholoas P. Lockyer) Sample handling for ToF-SIMS (Fraser Reich) Qualitative interpretation of spectra (David Briggs and Ian W. Fletcher) Multivariate analysis of SIMS spectra (Alex Henderson) ToF-SIMS image analysis (Bonnie J. Tyler) Characterisation of polymeric materials (Lutao Weng and Chiming Chan) li>Functional modification of surfaces using self-assembled monolayers (Amy Walker) Application of SIMS to study of biological systems (Alain M. Piwowar and Nicholas Winograd) Medical and biological applications of cluster ToF-SIMS (David Touboul, Oliver Laprevote and Alain Brunelle) Depth profiling of inorganic materials (Ewald Niehuis and Thomas Grehl) Depth profiling in organic electronics (Ewald Niehuis) Contamination monitoring and failure analysis (Arwa Ginwalla, Thomas, F. Fister and Ian A. Mowat) Photographic and digital graphic materials (Luc van Vaeck, Yannick Vercammen, Jens Lenaerts, Roel de Mondt, Jaymes van Luppen and Frank Vangaever) Applications of ToF-SIMS in cosmochemistry (Thomas Stephan and Ian C. Lyon) Index
by "Nielsen BookData"