Patent-related misconduct issues in U.S. litigation

著者

• Davidow, Joel
• Toupin, James

書誌事項

Patent-related misconduct issues in U.S. litigation

Joel Davidow and James Toupin

LexisNexis, c2014

2014 ed

• : [pbk.]

注記

Bibliography: p. 269-273

Includes index

• NII書誌ID(NCID): BB18392670
• ISBN:
  • 9781632812926
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: New Providence
• ページ数/冊数: vii, 273, 17, 2, 8 p.
• 大きさ: 24 cm
• 分類:
  • LCC : KF3155
  • DC22 : 346.7304/86
• 件名:
  • LCSH : Patent suits -- United States
  • LCSH : Patent infringement -- United States
  • LCSH : Patent laws and legislation -- United States -- Trial practice
  • LCSH : Patent practice -- United States