Microelectronic test patterns : an overview

Author(s)

• Buehler, Martin G.

Bibliographic Information

Microelectronic test patterns : an overview

Martin G. Buehler

（NBS special publication, 400-6 . Semiconductor measurement technology）

U.S. G.P.O., 1974

Access to Electronic Resource 2 items

• Microelectronic test patterns: an overview / [by] Martin G. Buehler.

  1974

  HathiTrust

  

• Microelectronic test patterns: an overview / [by] Martin G. Buehler. (400-6)

  1974

  HathiTrust

  

Note

References: p. 11

Details

• NCID: BB18570666
• LCCN: 74013001
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington
• Pages/Volumes: iv, 19 p.
• Size: 27 cm
• Classification:
  • LCC : QC100
  • LCC : TK7874
  • DC : 389/.08 s
  • DC : 621.381/73
• Subject Headings:
  • LCSH : Integrated circuits -- Testing
  • LCSH : Electronic apparatus and appliances -- Testing
• Parent Bibliography ID:
  • BA0011083X