Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes

著者

• Kenney, James M.

書誌事項

Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes

James M. Kenney

（NBS special publication, 400-7 . Semiconductor measurement technology）

U.S. G.P.O., 1976

電子リソースにアクセスする 全3件

• Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes / James M. Kenney.

  1976

  HathiTrust

  

• Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes / James M. Kenney ; Electronic Technology Division.

  1976

  HathiTrust

  

• Permanent damage effects of nuclear radiation on the X-band performance of silicon Schottky-barrier microwave mixer diodes / James M. Kenney ; Electronic Technology Division. (400-7)

  1976

  HathiTrust

  

詳細情報

• NII書誌ID(NCID): BB18570870
• LCCN: 76005868
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington
• ページ数/冊数: 26 p.
• 大きさ: 27 cm
• 分類:
  • LCC : QC100
  • LCC : TK7871.89
  • DC : 602/.1 s
  • DC : 621.3815/22
• 件名:
  • LCSH : Diodes, Schottky-barrier -- Effect of radiation on
  • LCSH : Mixing circuits
  • LCSH : Microwave measurements
• 親書誌ID:
  • BA0011083X