Techniques for measuring the integrity of passivation overcoats on integrated circuits

著者

• Kern, Werner
• Comizzoli, Robert B.

書誌事項

Techniques for measuring the integrity of passivation overcoats on integrated circuits

Werner Kern and Robert B. Comizzoli

（NBS special publication, 400-31 . Semiconductor measurement technology）

U.S. G.P.O., 1977

電子リソースにアクセスする 全2件

• Semiconductor measurement technology : techniques for measuring the integrity of passivation overcoats on integrated circuits / Werner Kern and Robert B. Comizzoli ; RCA Laboratories.

  1977

  HathiTrust

  

• Semiconductor measurement technology : techniques for measuring the integrity of passivation overcoats on integrated circuits / Werner Kern and Robert B. Comizzoli ; RCA Laboratories. (400-31)

  1977

  HathiTrust

  

注記

Includes bibliographical references

詳細情報

• NII書誌ID(NCID): BB18756573
• LCCN: 76608229
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Washington
• ページ数/冊数: xiv, 105 p.
• 大きさ: 26 cm
• 分類:
  • LCC : QC100
  • LCC : TK7874
  • DC : 602/.1 s
  • DC : 621.381/73
• 件名:
  • LCSH : Integrated circuits -- Passivation
  • LCSH : Protective coatings -- Testing
  • LCSH : Microelectronics -- Quality control
• 親書誌ID:
  • BA0011083X