{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BB18756573.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BB18756573#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BB18756573.json"},"dc:title":[{"@value":"Techniques for measuring the integrity of passivation overcoats on integrated circuits"}],"dc:creator":"Werner Kern and Robert B. Comizzoli","dc:publisher":[{"@value":"U.S. G.P.O."}],"dcterms:extent":"xiv, 105 p.","cinii:size":"26 cm","dc:language":"eng","dc:date":"1977","cinii:ncid":"BB18756573","cinii:ownerCount":"1","foaf:maker":[{"@id":"https://ci.nii.ac.jp/author/DA03864356#entity","@type":"foaf:Person","foaf:name":[{"@value":"Kern, Werner"}]},{"@type":"foaf:Person","foaf:name":[{"@value":"Comizzoli, Robert B."}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA001492","@type":"foaf:Organization","foaf:name":"東北大学 電気通信研究所 図書室","rdfs:seeAlso":{"@id":"http://opac.library.tohoku.ac.jp/opac/opac_openurl/?ncid=BB18756573"}}],"bibo:lccn":["76608229"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/76608229"}],"dcterms:hasFormat":[{"@id":"https://catalog.hathitrust.org/Record/003909530","dc:date":"1977"},{"@id":"https://catalog.hathitrust.org/Record/003909530","dc:title":"400-31","dc:date":"1977"}],"prism:publicationDate":["1977"],"cinii:note":["Includes bibliographical references"],"dc:subject":["LCC:QC100","LCC:TK7874","DC:602/.1 s","DC:621.381/73"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Integrated+circuits+--+Passivation","dc:title":"Integrated circuits -- Passivation"},{"@id":"https://ci.nii.ac.jp/books/search?q=Protective+coatings+--+Testing","dc:title":"Protective coatings -- Testing"},{"@id":"https://ci.nii.ac.jp/books/search?q=Microelectronics+--+Quality+control","dc:title":"Microelectronics -- Quality control"}],"dcterms:isPartOf":[{"@id":"https://ci.nii.ac.jp/ncid/BA0011083X#entity","dc:title":"NBS special publication, 400-31 . Semiconductor measurement technology","@type":"bibo:Book"}]}]}