Advanced measurement and test IV : selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China

著者

    • International Conference on Advanced Measurement and Test
    • Parvel, Ankdrew
    • Wu, Andy

書誌事項

Advanced measurement and test IV : selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China

edited by Ankdrew Parvel and Andy Wu

(Advanced materials research, v. 1083)

Trans Tech Publications, c2015

  • : pbk

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注記

Includes bibliographical references and indexes

内容説明・目次

内容説明

Collection of selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China. The 37 papers are grouped as follows: Chapter 1: Materials Science; Chapter 2: Material Processing and Testing Technology; Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies

目次

Preface and Organization Committee Chapter 1: Materials Science Adsorption of the Polyvinylidene Fluoride-Based Metal Affinity Membrane towards Bovine Serum Albumin Monomer Reactivity Ratios and Chain Segment Distribution for AM/2-EHA Copolymer The Preparation and Characterization of AM/2-EHA Copolymer as Profile Control Agent The Domain Dynamic in Fe-Based Amorphous Alloy Ribbons by Means Inductance Spectroscopy In Vitro Antitumor Efficacy of Puerarin Nanosuspension against Human HepG2 Cells Dependence of Granular Matrix Demagnetizing Factor on the Matrix Relative Size Study on Microstructure and Phase Composition of Co-8.8Al-9.8W Superalloy with Alloying Element Tantalum Water-Resistance Material from Fibers and Acrylic Emulsion Terpolymer Quercetin Molecularly Imprinted Polymers and its Application in the Separation and Analysis of Natural Products Fast and Efficient Synthesis of Mono-(6-p-toluenesulfonyl)- -cyclodextrin via Ultrasound Assisted Method Study on Phase Stability of Hexagonal Ba(Ti0.95Fe0.05)O3- Ceramic via Temperature-Dependent X-Ray Diffraction Chapter 2: Material Processing and Testing Technology The Experiment Research on Storage Characteristic of Multiple Melting Point PCM Surface Modification of SKD 61 by Electrical Discharge Coating (EDM/EDC) with Multilayer Rectangular Cross-Section Electrode and Jatropha curcas as Dielectric Fluid The Regular Pattern of Demagnetizing Factor Behaviour of Various 'Cores' of Granule-Ball Chains Determination of Nitrophenol Isomers in Water RP-HPLC-UV Method for Simultaneous Determination of Isoflavonoids in Huangqi Gegen and its Markted Formulations GFRP Bar: Determining Tensile Strength with Bending Test Research on Parameter Optimization of Mixed Gas IR SVM Calibration Model Measurement of Thermo-Radiation Characteristics of IR Window Materials Accurate Measurement on Cross Sectional Area of Single Filaments Using a Desktop SEM Chapter 3: Monitoring, Detection, Testing and Measurement Systems and Technologies A Research on High-Precision Strain Measurement Based on FBG with Temperature Compensation Development of Temperature and Magnetic Field Monitoring System of ITER HTS Magnet Surface Condensation Assessment Using Probabilistic Calculation Comparison of Optical and Scintillation Images Obtained by Using a Fiber-Optic Beta/Gamma Imaging Detector Stereo Image Matching Based on SURF Descriptor A Method of Experimental Design for GNSS-Dot Net under Jamming Attack A New Model to Accelerate Data Collection Frequency Measurement and Analysis on Liquid-Filled Pipe Based on Fiber Bragg Grating Sensor Simulation Analysis of the Multi-Parameter Influence on FBG Peak Reflectivity Influence of Transformer Rated Secondary Load Differences on Electric Energy Metering Testing Level Measurement Devices by Imitating Sensor Signals IV-Characteristics Measurement Error Resulting from Long Cables for Irradiated Bipolar Junction Transistors Numerical Simulation of Oblique Towing Tests and Rotating Arm Tests for a Submarine Model in Same Grid Topology A New Test Environment Approach to SEE Detection in MOSFETs Proposal of Software Solution to Distant Access of the Alarm Registration Centre to Technical Equipment Dual-Sequenced Real Coded Genetic Algorithm for Picking Process Optimization An Automatic Equipment for Measure of Electrical Characteristics of Nanoelectronic Devices

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詳細情報

  • NII書誌ID(NCID)
    BB1875688X
  • ISBN
    • 9783038353744
  • 出版国コード
    sz
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Pfaffikon
  • ページ数/冊数
    ix, 222 p.
  • 大きさ
    24 cm
  • 親書誌ID
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