Microelectronic test pattern NBS-4

Author(s)

    • Thurber, W. Robert
    • Buehler, Martin G.

Bibliographic Information

Microelectronic test pattern NBS-4

W. Robert Thurber and Martin G. Buehler

（NBS special publication, 400-32 . Semiconductor measurement technology）

U.S. G.P.O., 1978

Available at  / 1 libraries

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Note

Includes bibliographical references

Related Books： 1-1 of 1

  • NBS special publication

    Planning Office, National Bureau of Standards, U.S. Dept. of Commerce , For sale by the Supt. of Docs., U.S. Govt. Print. Off

    426, Suppl. 1

    Available at 1 libraries

Details

  • NCID
    BB18757237
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Washington
  • Pages/Volumes
    vi, 83 p.
  • Size
    26 cm
  • Parent Bibliography ID
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