Suppression of premature dielectric breakdown for high-voltage capacitance measurements

Author(s)

• Goodman, Alvin M.

Bibliographic Information

Suppression of premature dielectric breakdown for high-voltage capacitance measurements

Alvin M. Goodman

（NBS special publication, 400-37 . Semiconductor measurement technology）

U.S. G.P.O., 1977

Access to Electronic Resource 2 items

• Suppression of premature dielectric breakdown for high-voltage capacitance measurements / Alvin M. Goodman ; jointly supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards.

  1977

  HathiTrust

  

• Suppression of premature dielectric breakdown for high-voltage capacitance measurements / Alvin M. Goodman ; jointly supported by the Defense Advanced Research Projects Agency and the National Bureau of Standards. (1977)

  1977

  HathiTrust

  

Note

Includes bibliographical references

Details

• NCID: BB18761540
• LCCN: 77608129
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington
• Pages/Volumes: v, 21 p.
• Size: 26 cm
• Classification:
  • LCC : QC100
  • LCC : TK7872.C65
  • DC : 602/.1 s
  • DC : 621.31/5
• Subject Headings:
  • LCSH : Capacitors -- Testing
  • LCSH : Metal insulator semiconductors -- Testing
  • LCSH : Breakdown (Electricity)
  • LCSH : High voltages
• Parent Bibliography ID:
  • BA0011083X