A reverse-bias safe operating area transistor tester

Author(s)

• Berning, David W.

Bibliographic Information

A reverse-bias safe operating area transistor tester

David W. Berning

（NBS special publication, 400-54 . Semiconductor measurement technology）

U.S. G.P.O., 1979

Access to Electronic Resource 2 items

• A reverse-bias safe operating area transistor tester / David W. Berning.

  1979

  HathiTrust

  

• A reverse-bias safe operating area transistor tester / David W. Berning.

  no.400:54 1979

  HathiTrust

  

Note

Bibliography: p. 14

Details

• NCID: BB18863074
• LCCN: 78600157
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Washington
• Pages/Volumes: v, 37 p.
• Size: 26 cm
• Classification:
  • LCC : QC100
  • LCC : TK7871.9
• Subject Headings:
  • LCSH : Transistors -- Testing -- Equipment and supplies
• Parent Bibliography ID:
  • BA0011083X