Measurement techniques for high power semiconductor materials and devices : annual report, January 1 to December 31, 1976

Author(s)

    • Blackburn, D. L.
    • Koyama, R. Y.
    • Oettinger, F. F.
    • Rogers, G. J.

Bibliographic Information

Measurement techniques for high power semiconductor materials and devices : annual report, January 1 to December 31, 1976

D.L. Blackburn ... [et al.]

（NBSIR, 77-1249）

U.S. Dept. of Commerce, National Bureau of Standards, 1977

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Note

Includes bibliographical references

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  • NBSIR

    U.S. Dept. of Commerce, National Bureau of Standards

Details

  • NCID
    BB19064451
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    [Washington, D.C.]
  • Pages/Volumes
    iv, 87 p.
  • Size
    27 cm
  • Parent Bibliography ID
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