Measurement techniques for high power semiconductor materials and devices : annual report, January 1 to December 31, 1976

著者

• Blackburn, D. L.
• Koyama, R. Y.
• Oettinger, F. F.
• Rogers, G. J.

書誌事項

Measurement techniques for high power semiconductor materials and devices : annual report, January 1 to December 31, 1976

D.L. Blackburn ... [et al.]

（NBSIR, 77-1249）

U.S. Dept. of Commerce, National Bureau of Standards, 1977

注記

Includes bibliographical references

• NII書誌ID(NCID): BB19064451
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Washington, D.C.]
• ページ数/冊数: iv, 87 p.
• 大きさ: 27 cm
• 親書誌ID:
  • BA4848735X