Measurement techniques for high power semiconductor materials and devices : annual report, January 1 to December 31, 1977

Author(s)

    • Oettinger, F. F.

Bibliographic Information

Measurement techniques for high power semiconductor materials and devices : annual report, January 1 to December 31, 1977

F.F. Oettinger, editor

(NBSIR, 78-1474)

U.S. Dept. of Commerce, National Bureau of Standards, 1978

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Note

Includes bibliographical references

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  • NBSIR

    U.S. Dept. of Commerce, National Bureau of Standards

Details

  • NCID
    BB1906605X
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    [Washington, D.C.]
  • Pages/Volumes
    vii, 77 p.
  • Size
    27 cm
  • Parent Bibliography ID
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