Measurement techniques for high power semiconductor materials and devices : annual report, January 1 to December 31, 1977

著者

• Oettinger, F. F.

書誌事項

Measurement techniques for high power semiconductor materials and devices : annual report, January 1 to December 31, 1977

F.F. Oettinger, editor

（NBSIR, 78-1474）

U.S. Dept. of Commerce, National Bureau of Standards, 1978

注記

Includes bibliographical references

• NII書誌ID(NCID): BB1906605X
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: [Washington, D.C.]
• ページ数/冊数: vii, 77 p.
• 大きさ: 27 cm
• 親書誌ID:
  • BA4848735X