ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San José McEnery Convention Center San José, California, USA

Author(s)

• International Symposium for Testing and Failure Analysis
• ASM International
• Electronic Device Failure Analysis Society

Bibliographic Information

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San José McEnery Convention Center San José, California, USA

sponsored by EDFAS, ISTFA, ASM International

ASM International, 2013

Other Title

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis

Note

Includes bibliographical references and index

Details

• NCID: BB19614905
• ISBN:
  • 9781627080224
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Materials Park, Ohio
• Pages/Volumes: xix, 613 p.
• Size: 28 cm