ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San José McEnery Convention Center San José, California, USA
著者
書誌事項
ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San José McEnery Convention Center San José, California, USA
ASM International, 2013
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ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis
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注記
Includes bibliographical references and index
内容説明・目次
内容説明
This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect, understand, and eliminate electronic device and system failures. Case histories and review papers are included, as well as guides to new and unique tools and methodologies, applications and results.
Includes papers relating to the analysis of integrated circuits, MEMS, nanodevices, optoelectronics, discrete and passive components, electronic packaging, card level components, and electronic systems in the following areas:
New and emerging analytical concepts
Diagnostic testing and debug
Physical fault isolation (optical, thermal, magnetic, etc.)
Electrical characterisation and nanoprobing
Scanning probe technology
Microscopy (SEM, TEM, light microscopy, etc.)
Physical circuit-edit techniques (FIB, laser, etc.)
Sample preparation (milling, polishing, etching, grinding, etc.)
Chemical and materials analysis (Auger, SIMS, RBS, etc.)
Metrology and in-line characterisation and analysis
Yield and reliability enhancement
Competitive analysis
Image processing
Analytical thought process
Laboratory and environmental safety and green processes
Automation
Laboratory management and finance
Future challenges, especially those relating to the deep nanoscale regime
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