Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan

著者

• Yamada-Kaneta, Hiroshi
• Sakai, Akira
• International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

書誌事項

Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan

edited by Hiroshi Yamada-Kaneta, Akira Sakai

（Materials science forum, v. 725）

Trans Tech Pubs., Ltd., c2012

• : pbk

注記

Includes bibliographical references and indexes

詳細情報

• NII書誌ID(NCID): BB20186831
• ISBN:
  • 9783037854426
• 出版国コード: sz
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Durnten-Zurich
• ページ数/冊数: xiii, 299 p.
• 大きさ: 24 cm
• 親書誌ID:
  • BA00294222