Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan

Author(s)

    • Yamada-Kaneta, Hiroshi
    • Sakai, Akira
    • International Conference on Defects-Recognition, Imaging and Physics in Semiconductors

Bibliographic Information

Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan

edited by Hiroshi Yamada-Kaneta, Akira Sakai

（Materials science forum, v. 725）

Trans Tech Pubs., Ltd., c2012

  • : pbk

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Note

Includes bibliographical references and indexes

Related Books： 1-1 of 1

Details

  • NCID
    BB20186831
  • ISBN
    • 9783037854426
  • Country Code
    sz
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Durnten-Zurich
  • Pages/Volumes
    xiii, 299 p.
  • Size
    24 cm
  • Parent Bibliography ID
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