Imaging and manipulation of adsorbates using dynamic force microscopy : proceedings from the AtMol Conference Series, Nottingham, UK, April 16-17, 2013

著者

    • Moriarty, Philip
    • Workshop on Imaging and manipulation of adsorbates using dynamic force microscopy

書誌事項

Imaging and manipulation of adsorbates using dynamic force microscopy : proceedings from the AtMol Conference Series, Nottingham, UK, April 16-17, 2013

Philip Moriarty, Sebastién Gauthier, editors

(Advances in atom and single molecule machines / series editor, Christian Joachim)

Springer, c2015

  • : hardcover

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注記

"This book, ... stems from a two-day workshop associated with the Atomic Scale and Single Molecule Logic Gate Technologies (AtMol) project funded by the European Commission's Future and Emerging Technologies programme. ... The workshop in question, Imaging and Manipulating of Adsorbates Using Dynamic Force Microscopy, was held at the University of Nottingham during 16-17 April 2013."--Pref.

Includes bibliographical references and index

内容説明・目次

内容説明

Imaging and Manipulation of Adsorbates using Dynamic Force Microscopy provides an overview of the latest developments in dynamic force microscopy (DFM) of atoms, molecules, and nanoparticles adsorbed on solid surfaces. Significant advances in the capabilities of this technique have been made in the last decade and this book represents a timely snapshot of the major research themes in the field, with a particular focus on the manipulation of matter at the atomic and (sub)molecular levels. This edited volume will be of keen interest to researchers active in nanoscience and its various sub-fields including, in particular, scanning probe microscopy. This book expands on the previous volumes in the series Advances in Atom and Single Molecule Machines. DFM is an exceptionally powerful tool for the imaging and probing of adsorbates on insulators and is now a component of the type of multiprobe interconnection systems described in Vol. 1 of the series. DFM can also be used to translate atoms and molecules in the context of the fabrication of the type of logic gates described in Vol. 2. When used in conjunction with STM, DFM also enables a detailed comparison of the chemical 'architecture' of a molecule with the spatial distribution of its orbital density, as described in Vol. 3. In this book readers will gain key insights into the current capabilities, and future potential, of dynamic force microscopy.

目次

Pauli's Principle in Probe Microscopy.- Mechanical and Electrical Properties of Single Molecules.- Atom Manipulation Using Atomic Force Microscopy at Room Temperature.- A Considered Approach to Force Extraction from Dynamic Force Microscopy Measurements.- Theoretical Challenges of Simultaneous NC-AFM/STM Experiments.- Manipulation of Metal Nanoparticles on Insulating Surfaces.- Imaging of Defects on Ge(001):H by Non-Contact Atomic Force Microscopy.- Adsorption Structures of Amino Acids on Calcite/104).- NC-AFM and KPFM Study of the Adsorption of a Triphenylene Derivative on KBr(001).

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詳細情報

  • NII書誌ID(NCID)
    BB2022840X
  • ISBN
    • 9783319174006
  • 出版国コード
    sz
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Cham
  • ページ数/冊数
    xx, 154 p.
  • 大きさ
    25 cm
  • 親書誌ID
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