An introduction to logic circuit testing
著者
書誌事項
An introduction to logic circuit testing
（Synthesis Lectures on digital circuits and systems, 17）
Morgan & Claypool Publishers, c2009
- : [pbk.]
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注記
Includes bibliographical references
内容説明・目次
内容説明
An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips.
目次
Introduction
Fault Detection in Logic Circuits
Design for Testability
Built-in Self-Test
References
「Nielsen BookData」 より