{"@context":{"owl":"http://www.w3.org/2002/07/owl#","bibo":"http://purl.org/ontology/bibo/","foaf":"http://xmlns.com/foaf/0.1/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/"},"@id":"https://ci.nii.ac.jp/ncid/BB20350957.json","@graph":[{"@id":"https://ci.nii.ac.jp/ncid/BB20350957#entity","@type":"bibo:Book","foaf:isPrimaryTopicOf":{"@id":"https://ci.nii.ac.jp/ncid/BB20350957.json"},"dc:title":[{"@value":"Fundamentals of atomic force microscopy"}],"dc:creator":"Ronald Reifenberger","dc:publisher":[{"@value":"World Scientific"}],"dcterms:extent":"xv, 324 p.","cinii:size":"23 cm","dc:language":"eng","dc:date":"2016","cinii:ncid":"BB20350957","cinii:ownerCount":"1","foaf:maker":[{"@type":"foaf:Person","foaf:name":[{"@value":"Reifenberger, Ronald"}]}],"bibo:owner":[{"@id":"https://ci.nii.ac.jp/library/FA002484","@type":"foaf:Organization","foaf:name":"名古屋大学 理学 図書室","rdfs:seeAlso":{"@id":"https://m-opac.nul.nagoya-u.ac.jp/iwjs0023opc/ufirdi.do?ufi_target=ctlsrh&ncid=BB20350957&initFlg=_RESULT_SET_NOTBIB"}}],"bibo:lccn":["2014029164"],"rdfs:seeAlso":[{"@id":"https://lccn.loc.gov/2014029164"}],"prism:publicationDate":["c2016"],"cinii:note":["pt. 1: Foundations","Includes bibliographical references and index"],"dc:subject":["LCC:QH212.A78","DC23:502.8/2"],"foaf:topic":[{"@id":"https://ci.nii.ac.jp/books/search?q=Atomic+force+microscopy","dc:title":"Atomic force microscopy"}],"dcterms:isPartOf":[{"@id":"https://ci.nii.ac.jp/ncid/BB10543331#entity","dc:title":"Lessons from nanoscience : a lecture note series / series editors, Mark Lundstrom and Suprio Datta, v. 4","@type":"bibo:Book"}],"dcterms:hasPart":[{"@id":"urn:isbn:9789814630351","dc:title":"pt. 1 : pbk."}]}]}