Noncontact atomic force microscopy

Author(s)

• 森田, 清三 モリタ, セイゾウ
• Giessibl, Franz J.
• Meyer, Ernst
• Wiesendanger, Roland

Bibliographic Information

Noncontact atomic force microscopy

Seizo Morita ...[et al.], editors

（Nanoscience and technology, v. 3）

Springer, c2015

• :hbk.

Details

• NCID: BB20861821
• ISBN:
  • 9783319155876
• Country Code: sz
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Cham
• Pages/Volumes: xviii, 527 p.
• Size: 24 cm
• Classification:
  • DC23 : 620.5
• Subject Headings:
  • LCSH : Atomic force microscopy
• Parent Bibliography ID:
  • BA33734375