2015 IEEE International Test Conference : (ITC 2015) : Anaheim, California, USA, 6-8 October 2015

Bibliographic Information

2015 IEEE International Test Conference : (ITC 2015) : Anaheim, California, USA, 6-8 October 2015

IEEE, c2015

Other Title

CFP15ITC-POD

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Note

"IEEE catalog Number: CFP15ITC-POD"

Includes bibliographical references

Details

  • NCID
    BB20991849
  • ISBN
    • 9781467365796
  • Country Code
    us
  • Title Language Code
    eng
  • Text Language Code
    eng
  • Place of Publication
    Piscataway, N.J.
  • Pages/Volumes
    xii, 403 p.
  • Size
    28 cm
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