ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis, November 1-5, 2015 Oregon Convention Center, Portland, Oregon, USA

著者

• International Symposium for Testing and Failure Analysis
• ASM International
• Electronic Device Failure Analysis Society

書誌事項

ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis, November 1-5, 2015 Oregon Convention Center, Portland, Oregon, USA

ASM International, c2015

• : pbk

タイトル別名

ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis

注記

Conference proceedings

Includes bibliographical references and index

詳細情報

• NII書誌ID(NCID): BB21652485
• ISBN:
  • 9781627081023
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Materials Park, Ohio
• ページ数/冊数: xvi, 520 p.
• 大きさ: 28 cm
• 分類:
  • DC23 : 621.381
• 件名:
  • LCSH : Electronics -- Materials -- Testing -- Congresses
  • LCSH : Electronic apparatus and appliances -- Testing -- Congresses