ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis, November 1-5, 2015 Oregon Convention Center, Portland, Oregon, USA

著者

• International Symposium for Testing and Failure Analysis
• ASM International
• Electronic Device Failure Analysis Society

書誌事項

ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis, November 1-5, 2015 Oregon Convention Center, Portland, Oregon, USA

ASM International, c2015

• : pbk

タイトル別名

ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis

注記

Conference proceedings

Includes bibliographical references and index

内容説明・目次

内容説明

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!

「Nielsen BookData」 より

詳細情報

• NII書誌ID(NCID): BB21652485
• ISBN:
  • 9781627081023
• 出版国コード: us
• タイトル言語コード: eng
• 本文言語コード: eng
• 出版地: Materials Park, Ohio
• ページ数/冊数: xvi, 520 p.
• 大きさ: 28 cm
• 分類:
  • DC23 : 621.381
• 件名:
  • LCSH : Electronics -- Materials -- Testing -- Congresses
  • LCSH : Electronic apparatus and appliances -- Testing -- Congresses