ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis, November 1-5, 2015 Oregon Convention Center, Portland, Oregon, USA

Author(s)

• International Symposium for Testing and Failure Analysis
• ASM International
• Electronic Device Failure Analysis Society

Bibliographic Information

ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis, November 1-5, 2015 Oregon Convention Center, Portland, Oregon, USA

ASM International, c2015

• : pbk

Other Title

ISTFA 2015 : conference proceedings from the 41st international symposium for testing and failure analysis

Note

Conference proceedings

Includes bibliographical references and index

Description and Table of Contents

Description

This volume features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers address the symposium's theme, Follow the Data!

by "Nielsen BookData"

• NCID: BB21652485
• ISBN:
  • 9781627081023
• Country Code: us
• Title Language Code: eng
• Text Language Code: eng
• Place of Publication: Materials Park, Ohio
• Pages/Volumes: xvi, 520 p.
• Size: 28 cm
• Classification:
  • DC23 : 621.381
• Subject Headings:
  • LCSH : Electronics -- Materials -- Testing -- Congresses
  • LCSH : Electronic apparatus and appliances -- Testing -- Congresses